Update #1: This calibration will be rescheduled due to an unfavorable space weather environment at this time. A new notification will be sent once a new date is determined.
Topic: GOES-16 (GOES-EAST) SEISS MPS-LO Electron and Ion Microchannel Plate (MCP) HV Bias Calibration scheduled for July 26, 2018
Date/Time Issued: July 24, 2018 2000 UTC
Product(s) or Data Impacted: GOES-16 SEISS MPS-LO
Date/Time of Initial Impact: July 26, 2018 1500 UTC
Date/Time of Expected End: July 27, 2018 1700 UTC
Length of Outage: MPS-LO data will be degraded for a two-hour period starting July 26 at 1500 UTC. Upon conclusion of calibration activities, MPS-LO Deflection Electrode High Voltage will be powered off for 24 hours to collect performance data before being powered on the following day, restoring SEISS MPS-LO sensor to nominal operation.
Details/Specifics of Change:
A GOES-16 (GOES-EAST) SEISS MPS-LO Electron and Ion Microchannel Plate (MCP) HV Bias Calibration will be performed on Thursday, July 26, 2018, at 1500 UTC resulting in a SEISS MPS-LO data degradation for the 26 hour calibration period. The SEISS MPS-LO Calibration will be cancelled due to CWD or if the Space Weather environment is not appropriate for the calibration. If NWS Regions or NCEI have any operational concerns, please contact the NCEP SDM (301) 683-1500 at least 24 hours prior to the maneuver time.
Contact Information for Further Information: ESPC Operations at ESPCOperations@noaa.gov or 301-817-3880
Web Site(s) for applicable information:
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