Topic: GOES-16 (GOES-EAST) SEISS MPS-LO Electron and Ion Microchannel Plate (MCP) HV Bias Calibration

Date/Time Issued: March 14, 2019 1508 UTC

Product(s) or Data Impacted: GOES-16 SEISS MPS-LO

Date/Time of Initial Impact: March 19, 2019 1500 UTC

Date/Time of Expected End: March 20, 2019 1700 UTC

Length of Outage: 26 hours of product degradation


Details/Specifics of Change:

A GOES-16 (GOES-EAST) SEISS MPS-LO Electron and Ion Microchannel Plate (MCP) HV Bias Calibration will be performed on Tuesday, March 19, 2019, from 1500-1700 UTC resulting in a SEISS MPS-LO data degradation for 2 hours. Upon conclusion of calibration activities, MPS-LO Deflection Electrode High Voltage will be powered off for 24 hours to collect performance data before being powered on the following day. SEISS MPS-LO M-Bwill experience data degradation during this 24 hour period until the Deflection Electrode High Voltage is powered back on returning the sensor to nominal operation.


The SEISS MPS-LO Calibration will be cancelled due to CWD or if the Space Weather environment is not appropriate for the calibration. If NWS Regions or NCEI have any operational concerns, please contact the NCEP SDM (301) 683-1500 at least 24 hours prior to the maneuver time.

Contact Information for Further Information: ESPC Operations at or 301-817-3880

Web Site(s) for applicable information:

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