Update #1: The outage period will now be 29 hours
instead of a 26 hours.
Topic: GOES-17 SEISS MPS-LO Electron and Ion Microchannel
Plate (MCP) HV Bias Calibration
Date/Time Issued: September 18, 2019 1155Z
Product(s) or Data Impacted: GOES-17 SEISS MPS-LO
Date/Time of Initial Impact: September 17, 2019 1600Z
Date/Time of Expected End: September 18, 2019 1800Z (September
18, 2019 2100Z)
Length of Outage: 26 hours of product degradation
Details and Specifics of Change: A GOES-17 (GOES-WEST) SEISS
MPS-LO Electron and Ion Microchannel Plate (MCP) HV Bias Calibration
will be performed on Tuesday September 17, 2019, from 1600-1800Z
resulting in a SEISS MPS-LO data degradation for 2 hours. Upon
conclusion of calibration activities, MPS-LO Deflection Electrode
High Voltage will be powered off for 24 hours to collect performance
data before being powered on the following day. SEISS MPS-LO will
experience data degradation during this 26 hour period until the
Deflection Electrode High Voltage is powered back on returning the
sensor to nominal operation.
The SEISS MPS-LO Calibration will be cancelled due to CWD or if the
Space Weather environment is not appropriate for the calibration.
Contact Information for Further Information: ESPC Operations
Web Site(s) for applicable information: N/A
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