Topic: GOES-17 SEISS MPS-LO Electron and Ion Microchannel Plate (MCP) HV Bias Calibration (impacts SEISS)
Date/Time Issued: August 31, 2020 1857Z
Product(s) or Data Impacted: GOES-17 SEISS MPS-LO
Date/Time of Initial Impact: September 3, 2020 1330Z
Date/Time of Expected End: September 4, 2020 1530Z
Length of Outage: 26 hours of product degradation
Details/Specifics of Change:
A GOES-17 (GOES-WEST) SEISS MPS-LO Electron and Ion Microchannel Plate (MCP) HV Bias Calibration will be performed from 2020/247T13:30z to 2020/248T15:30z. The calibration will consist of 2 hours of commanding followed by a 24 hour power off of the MPS-LO Deflection Electrode High Voltage (required for performance data collection). SEISS MPS-LO will experience data degradation during this 26 hour period until the Deflection Electrode High Voltage is powered back on returning the sensor to nominal operation.
The SEISS MPS-LO Calibration will be cancelled due to CWD or if the Space Weather environment is not appropriate for the calibration.
Contact Information for Further Information: ESPC Operations at ESPCOperations@noaa.gov or 301-817-3880 or GOES Payload Engineering: 301-817-4409
Web Site(s) for applicable information: N/A
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