Topic: GOES-18 SEISS MPS-LO Electron and Ion Microchannel Plate (MCP) HV Bias Calibration (impacts SEISS)

Date/Time Issued: January 19, 2023 2010Z

Product(s) or Data Impacted: GOES-18 SEISS MPS-LO

Date/Time of Initial Impact: January 26, 2023 1500Z

Date/Time of Expected End: January 27, 2023 1730Z

Length of Outage: 26.5 hours of product degradation

Details/Specifics of Change: A GOES-18 (GOES-WEST) SEISS MPS-LO Electron and Ion Microchannel Plate (MCP) HV Bias Calibration will be performed from 2023/026T 1500z to 2023/027T 1730z. The calibration will consist of 2 hours of commanding followed by a 24.5 hour power off of the MPS-LO Deflection Electrode High Voltage (required for performance data collection). SEISS MPS-LO will experience data degradation during this 26.5 hour period until the Deflection Electrode High Voltage is powered back on returning the sensor to nominal operation.

The SEISS MPS-LO Calibration will be cancelled due to CWD or if the Space Weather environment is not appropriate for the calibration.

Contact Information for Further Information: ESPC Operations at or 301-817-3880 GOES Payload Engineering: 301-817-4409