Update #1: The GOES-16 SEISS MPS-Lo HV Optimization has been postponed due to high local space weather environment. Rescheduled date TBD.
Topic: GOES-16 SEISS MPS-LO Electron and Ion Microchannel Plate (MCP) HV Bias Calibration (impacts SEISS)
Date/Time Issued: June 20, 2023 1520Z
Product(s) or Data Impacted: GOES-16 SEISS MPS-LO
Date/Time of Initial Impact: June 20, 2023 1630z
Date/Time of Expected End: June 21, 2023 1900z
Length of Outage: 26.5 hours of product degradation
Details/Specifics of Change:
A GOES-16 (GOES-EAST) SEISS MPS-LO Electron and Ion Microchannel Plate (MCP) HV Bias Calibration will be performed from 2023/171 1630z to 2023/172 1900z. The calibration will consist of 2 hours of commanding followed by a 24.5 hour power off of the MPS-LO Deflection Electrode High Voltage (required for performance data collection). SEISS MPS-LO will experience data degradation during this 26.5 hour period until the Deflection Electrode High Voltage is powered back on returning the sensor to nominal operation.
The SEISS MPS-LO Calibration will be canceled due to CWD or if the Space Weather environment is not appropriate for the calibration.
Contact Information for Further Information: ESPC Operations at ESPCOperations@noaa.gov at 301-817-3880
Web Site(s) for applicable information: N/A
This message was sent to ESPC.Notification@noaa.gov. You have been sent this and other notifications because you have opted in to receive it. If for any reason, you wish to unsubscribe, please contact ESPC.