Topic: GOES-18 SEISS MPS-LO Electron and Ion Microchannel Plate (MCP) HV Bias Calibration (impacts SEISS)
Date/Time Issued: February 1, 2024 2216Z
Product(s) or Data Impacted: GOES-18 SEISS MPS-LO
Date/Time of Initial Impact: February 8, 2024 1930Z
Date/Time of Expected End: February 8, 2024 2200Z
Length of Outage: 26.5 hours of product degradation
Details/Specifics of Change:
A GOES-18 (GOES-WEST) SEISS MPS-LO Electron and Ion Microchannel Plate (MCP) HV Bias Calibration will be performed from 2023/214T 1930z to 2023/215T 2200z. The calibration will consist of 2 hours of commanding followed by a 24.5 hour power off of the MPS-LO Deflection Electrode High Voltage (required for performance data collection). SEISS MPS-LO will experience data degradation during this 26.5 hour period until the Deflection Electrode High Voltage is powered back on returning the sensor to nominal operation.
The SEISS MPS-LO Calibration will be canceled due to CWD or if the Space Weather environment is not appropriate for the calibration.
Contact Information for Further Information: ESPC Operations at ESPCOperations@noaa.gov or 301-817-3880 GOES Payload Engineering: 301-817-4409