Topic: GOES-19 SEISS MPS-LO Electron and Ion Microchannel Plate (MCP) HV Bias Calibration (impacts SEISS)

Date/Time Issued: September 23, 2025 1556Z

Product(s) or Data Impacted: GOES-19 SEISS MPS-LO

Date/Time of Initial Impact: September 30, 2025 1600Z (273)

Date/Time of Expected End: October 1, 2025 1830Z (274)

Length of Outage: 26.5 hours of product degradation

Details/Specifics of Change: A GOES-19 (GOES-EAST) SEISS MPS-LO Electron and Ion Microchannel Plate (MCP) HV Bias Calibration will be performed from 2025/273 1600Z to 2025/274 1830Z. The calibration will consist of 2 hours of commanding followed by a 24.5 hour power off of the MPS-LO Deflection Electrode High Voltage (required for performance data collection). SEISS MPS-LO will experience data degradation during this 26.5 hour period until the Deflection Electrode High Voltage is powered back on returning the sensor to nominal operation.

The SEISS MPS-LO Calibration will be canceled due to CWD or if the Space Weather environment is not appropriate for the calibration.

Contact for Further Information: ESPC Operations: ESPCOperations@noaa.gov or 301-817-3880; GOES Payload Engineering: 301-817-4409

Web Site(s) for applicable information: N/A

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