Topic: GOES-18 SEISS MPS-LO Electron and Ion Microchannel Plate (MCP) HV Bias Calibration (impacts SEISS)

Date/Time Issued: March 03, 2026 2030Z

Product(s) or Data Impacted: GOES-18 SEISS MPS-LO

Date/Time of Initial Impact: March 10, 2026 1930Z

Date/Time of Expected End: March 11, 2026 2200Z

Length of Outage: 26.5 hours of product degradation

Details/Specifics:

A GOES-18 (GOES-WEST) SEISS MPS-LO Electron and Ion Microchannel Plate (MCP) HV Bias Calibration will be performed from 2026/069T 1930z to 2026/070T 2200z. The calibration will consist of 2 hours of commanding followed by a 24.5 hour power off of the MPS-LO Deflection Electrode High Voltage (required for performance data collection). SEISS MPS-LO will experience data degradation during this 26.5 hour period until the Deflection Electrode High Voltage is powered back on returning the sensor to nominal operation.

The SEISS MPS-LO Calibration will be canceled due to CWD or if the Space Weather environment is not appropriate for the calibration.

Contact Information for Further Information: ESPC Operations at ESPCOperations@noaa.gov or 301-817-3880 GOES Payload Engineering: 301-817-4409  

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